"An approach to dynamic power consumption current testing of CMOS ICs."

Jaume A. Segura et al. (1995)

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DOI: 10.1109/VTEST.1995.512623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-20

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  persistent URL:
  - https://dblp.org/rec/conf/vts/SeguraRMR95
Jaume A. Segura, Miquel Roca, Diego Mateo, Antonio Rubio:
An approach to dynamic power consumption current testing of CMOS ICs. VTS 1995: 95-100

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