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"A new methodology for realistic open defect detection probability ..."

Jesús Moreno, Víctor H. Champac, Michel Renovell (2011)

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DOI: 10.1109/VTS.2011.5783781

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-10

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Jesús Moreno, Víctor H. Champac, Michel Renovell:
A new methodology for realistic open defect detection probability evaluation under process variations. VTS 2011: 184-189

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