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"Test time reduction using parallel RF test techniques."

Rajesh Mittal, Adesh Sontakke, Rubin A. Parekhji (2010)

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DOI: 10.1109/VTS.2010.5469623

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Rajesh Mittal, Adesh Sontakke, Rubin A. Parekhji:
Test time reduction using parallel RF test techniques. VTS 2010: 40

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