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"Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for ..."

Liang Zhao et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830289

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-22

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Liang Zhao, Z. Chen, Dan Manea, S. Li, J. Li, Y. Zhu, Z. Sui, Zhichao Lu:
Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications. VLSI Technology and Circuits 2022: 316-317

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