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"Novel Strategies for Highly Uniform and Reliable Cell Characteristics of ..."

Changhwan Lee et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185390

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-30

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  - conf/vlsit/LeeYPLKLLLPAH23
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  - https://dblp.org/rec/conf/vlsit/LeeYPLKLLLPAH23
Changhwan Lee, Min-Tai Yu, Sejun Park, Hoki Lee, Bio Kim, Suhwan Lim, Jaeduk Lee, Sung-Hun Lee, Mincheol Park, Sujin Ahn, Sunghoi Hur:
Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory. VLSI Technology and Circuits 2023: 1-2

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