"A Temporal Noise Reduction via 40% Enhanced Conversion Gain in Dual-Pixel ..."

Seunghwan Lee et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631436

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-17

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Seunghwan Lee, Jeongjin Cho, Shinyoung Choi, Sung Yoon Min, Eunjung Lee, Minji Jung, Kyoungmok Son, Hyunchaul Jeong, Heetak Han, Sachoun Park, Sanghyuck Moon, Seungki Jung, Junseok Yang, Taesub Jung, Howoo Park, Bumsuk Kim, Kyungho Lee, Jesuk Lee:
A Temporal Noise Reduction via 40% Enhanced Conversion Gain in Dual-Pixel CMOS Image Sensor with Full-Depth Deep-Trench Isolation and Locally Lowered-Stack Technology. VLSI Technology and Circuits 2024: 1-2

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