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"High Bit Cost Scalability and Reliable Cell Characteristics for 7th ..."
Kyungmoon Kim et al. (2023)
- Kyungmoon Kim, Yujeong Seo, Sejun Park, Woojae Jang, Dongho Yoo, Joonsung Lim, Il-Han Park, Jaeduk Lee, Kyungyoon Noh, Sujin Ahn, Sunghoi Hur:
High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash. VLSI Technology and Circuits 2023: 1-2
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