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"Compact Modeling of IGZO-based CAA-FETs with Time-zero-instability and BTI ..."

Jingrui Guo et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830482

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-04

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  dblp key:
  - conf/vlsit/GuoSWDHWFCHXGJY22
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  - https://dblp.org/rec/conf/vlsit/GuoSWDHWFCHXGJY22
Jingrui Guo, Ying Sun, Lingfei Wang, Xinlv Duan, Kailiang Huang, Zhaogui Wang, Junxiao Feng, Qian Chen, Shijie Huang, Lihua Xu, Di Geng, Guangfan Jiao, Shihui Yin, Zhengbo Wang, Weiliang Jing, Ling Li, Ming Liu:
Compact Modeling of IGZO-based CAA-FETs with Time-zero-instability and BTI Impact on Device and Capacitor-less DRAM Retention Reliability. VLSI Technology and Circuits 2022: 300-301

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