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ORCID"Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test ..."
Josh Yang, Baosheng Wang, André Ivanov (2004)
- Josh Yang, Baosheng Wang, André Ivanov:
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode. VLSI Design 2004: 493-498
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