"New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss."

Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal (2003)

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DOI: 10.1109/ICVD.2003.1183162

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal:
New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. VLSI Design 2003: 353-360

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