"Test generation for mixed-signal devices using signal flow graphs."

Rajesh Ramadoss, Michael L. Bushnell (1996)

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DOI: 10.1109/ICVD.1996.489493

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rajesh Ramadoss, Michael L. Bushnell:
Test generation for mixed-signal devices using signal flow graphs. VLSI Design 1996: 242-248

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