"A Complete Characterization of Path Delay Faults through Stuck-at Faults."

Subhashis Majumder et al. (1999)

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DOI: 10.1109/ICVD.1999.745203

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell:
A Complete Characterization of Path Delay Faults through Stuck-at Faults. VLSI Design 1999: 492-497

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