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"Evaluation of Device Parameters of HfO2/SiO2/Si Gate Dielectric Stack for ..."
A. Madan et al. (2005)
- A. Madan, S. C. Bose, P. J. George, Chandra Shekhar:
Evaluation of Device Parameters of HfO2/SiO2/Si Gate Dielectric Stack for MOSFETs. VLSI Design 2005: 386-391
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