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"Testability Properties of Local Circuit Transformations with Respect to ..."

Harry Hengster, Rolf Drechsler, Bernd Becker (1994)

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DOI: 10.1109/ICVD.1994.282669

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Harry Hengster, Rolf Drechsler, Bernd Becker:
Testability Properties of Local Circuit Transformations with Respect to the Robust Path-Delay-Fault Model. VLSI Design 1994: 123-126

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