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ORCID"On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit ..."
Sunil R. Das et al. (1994)
- Sunil R. Das, Wen-Ben Jone, Amiya Nayak, Ian Choi:
On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit Decomposition. VLSI Design 1994: 311-314
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