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"An improved output compaction technique for built-in self-test in VLSI ..."
Sunil R. Das et al. (1995)
- Sunil R. Das, H. T. Ho, Wen-Ben Jone, Amiya R. Nayak:
An improved output compaction technique for built-in self-test in VLSI circuits. VLSI Design 1995: 403-407
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