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"An improved output compaction technique for built-in self-test in VLSI ..."

Sunil R. Das et al. (1995)

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DOI: 10.1109/ICVD.1995.512147

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/DasHJN95
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/DasHJN95
Sunil R. Das, H. T. Ho, Wen-Ben Jone, Amiya R. Nayak:
An improved output compaction technique for built-in self-test in VLSI circuits. VLSI Design 1995: 403-407

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