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"Low-cost DC built-in self-test of linear analog circuits using checksums."

Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi (1996)

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DOI: 10.1109/ICVD.1996.489490

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/ChatterjeeKN96
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/ChatterjeeKN96
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design 1996: 230-233

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