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"An Efficient Test Generation Technique for Sequential Circuits with ..."

Dhruva R. Chakrabarti, Ajai Jain (1996)

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DOI: 10.1109/ICVD.1996.489480

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vlsid/ChakrabartiJ96
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  - https://dblp.org/rec/conf/vlsid/ChakrabartiJ96
Dhruva R. Chakrabarti, Ajai Jain:
An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. VLSI Design 1996: 174-177

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