"A New Method for Generating Tests for Delay Faults in Non-Scan Circuits."

Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth (1992)

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DOI: 10.1109/ICVD.1992.658013

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth:
A New Method for Generating Tests for Delay Faults in Non-Scan Circuits. VLSI Design 1992: 4-11

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