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"Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and ..."

Maedeh Hemmat et al. (2016)

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DOI: 10.1007/978-3-319-67104-8_3

access: closed

type: Conference or Workshop Paper

metadata version: 2017-09-05

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Maedeh Hemmat, Mehdi Kamal, Ali Afzali-Kusha, Massoud Pedram:
Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors. VLSI-SoC (Selected Papers) 2016: 41-59

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