"A Predictive Process Design Kit for Three-Independent-Gate Field-Effect ..."

Patsy Cadareanu et al. (2019)

> Home

Details and statistics

DOI: 10.1007/978-3-030-53273-4_14

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi/CadareanuGGG19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi/CadareanuGGG19
Patsy Cadareanu, Ganesh Gore, Edouard Giacomin, Pierre-Emmanuel Gaillardon:
A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors. VLSI-SoC (Selected Papers) 2019: 307-322

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.