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"Output selection for test response compaction based on multiple counters."

Wei-Cheng Lien et al. (2014)

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DOI: 10.1109/VLSI-DAT.2014.6834865

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh:
Output selection for test response compaction based on multiple counters. VLSI-DAT 2014: 1-4

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