"Test strategies for the clock and power distribution networks in a ..."

Shi-Yu Huang (2017)

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DOI: 10.1109/VLSI-DAT.2017.7939646

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type: Conference or Workshop Paper

metadata version: 2017-06-20

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Shi-Yu Huang:
Test strategies for the clock and power distribution networks in a multi-die IC. VLSI-DAT 2017: 1-2

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