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"Robust test pattern generation for hold-time faults in nanometer technologies."
Yu-Hao Ho et al. (2017)
- Yu-Hao Ho, Yo-Wei Chen, Chih-Ming Chang, Kai-Chieh Yang, James Chien-Mo Li:
Robust test pattern generation for hold-time faults in nanometer technologies. VLSI-DAT 2017: 1-4
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