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"Accelerating Electromigration Wear-Out Effects Based on Configurable ..."

Sheriff Sadiqbatcha et al. (2018)

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DOI: 10.1109/SMACD.2018.8434891

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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  - conf/smacd/SadiqbatchaCST18
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  - https://dblp.org/rec/conf/smacd/SadiqbatchaCST18
Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan:
Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. SMACD 2018: 21-24

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