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"Experimental analysis of flip-flops minimum operating voltage in 28nm ..."

Sebastien Bernard et al. (2014)

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DOI: 10.1109/PATMOS.2014.6951896

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Sebastien Bernard, Marc Belleville, Alexandre Valentian, Jean-Didier Legat, David Bol:
Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature. PATMOS 2014: 1-7

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