"A programmable built-in self-test for embedded DRAMs."

Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya (2005)

Details and statistics

DOI: 10.1109/MTDT.2005.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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