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"Test Collections for Patent Retrieval and Patent Classification in the ..."

Atsushi Fujii, Makoto Iwayama, Noriko Kando (2006)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2019-08-19

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  - electronic edition @ lrec-conf.org (open access)
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  dblp key:
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  - https://dblp.org/rec/conf/lrec/FujiiIK06
Atsushi Fujii, Makoto Iwayama, Noriko Kando:
Test Collections for Patent Retrieval and Patent Classification in the Fifth NTCIR Workshop. LREC 2006: 671-674

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