"Radiation damage characterization of digital integrated circuits."

Santiago Martin Sondón et al. (2009)

> Home

Details and statistics

DOI: 10.1109/LATW.2009.4813811

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/latw/SondonMJPAF09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/SondonMJPAF09
Santiago Martin Sondón, Pablo Sergio Mandolesi, Pedro Julián, Felix Palumbo, Martin Alurralde, Alberto Filevich:
Radiation damage characterization of digital integrated circuits. LATW 2009: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.