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"A probabilistic model for stuck-on faults in combinational logic gates."

Rafael B. Schivittz et al. (2016)

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DOI: 10.1109/LATW.2016.7483337

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/latw/SchivittzFMB16
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  - https://dblp.org/rec/conf/latw/SchivittzFMB16
Rafael B. Schivittz, Denis Teixeira Franco, Cristina Meinhardt, Paulo F. Butzen:
A probabilistic model for stuck-on faults in combinational logic gates. LATS 2016: 39-44

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