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"Fault simulation in radiation-hardened SOI CMOS VLSIs using universal ..."

Konstantin O. Petrosyants et al. (2016)

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DOI: 10.1109/LATW.2016.7483350

access: closed

type: Conference or Workshop Paper

metadata version: 2017-09-16

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  - conf/latw/PetrosyantsSKL16
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Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov:
Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model. LATS 2016: 117-122

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