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"Functional test generation for the pLRU replacement mechanism of embedded ..."

Wilson J. Pérez H. et al. (2011)

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DOI: 10.1109/LATW.2011.5985898

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-28

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Wilson J. Pérez H., Ernesto Sánchez, Matteo Sonza Reorda, Alberto Tonda, Jaime Velasco-Medina:
Functional test generation for the pLRU replacement mechanism of embedded cache memories. LATW 2011: 1-6

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