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"Risks Associated with Faults within Test Pattern Compactors and Their ..."

Cecilia Metra, T. M. Mak, Martin Omaña (2004)

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DOI: 10.1109/TEST.2004.1387395

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/MetraMO04
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  persistent URL:
  - https://dblp.org/rec/conf/itc/MetraMO04
Cecilia Metra, T. M. Mak, Martin Omaña:
Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing. ITC 2004: 1223-1231

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