"Functional Test Generation of Digital LSI/VLSI Systems Using Machine ..."

Tonysheng Lin, Stephen Y. H. Su (1984)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Tonysheng Lin, Stephen Y. H. Su:
Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. ITC 1984: 660-668

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