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"DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs."
Osamu Hirabayashi et al. (2002)
- Osamu Hirabayashi, Azuma Suzuki, Tomoaki Yabe, Atsushi Kawasumi, Yasuhisa Takeyama, Keiichi Kushida, Akihito Tohata, Nobuaki Otsuka:
DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs. ITC 2002: 164-169
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