"Classification and Test Generation for Path-Delay Faults Using Single ..."

Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal (1995)

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DOI: 10.1109/TEST.1995.529827

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests. ITC 1995: 139-148

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