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"Process Window and Device Variations Evaluation using Array-Based ..."

C. Tabery et al. (2006)

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DOI: 10.1109/ISQED.2006.107

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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  - https://dblp.org/rec/conf/isqed/TaberyCBWMERHE06
C. Tabery, M. Craig, Gert Burbach, B. Wagner, S. McGowan, P. Etter, S. Roling, C. Haidinyak, E. Ehrichs:
Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. ISQED 2006: 260-265

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