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E. Ehrichs

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2000 – 2009

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2006
[c2]
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  dblp key:
  - conf/isqed/TaberyCBWMERHE06
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  - https://dblp.org/rec/conf/isqed/TaberyCBWMERHE06
C. Tabery, M. Craig, Gert Burbach, B. Wagner, S. McGowan, P. Etter, S. Roling, C. Haidinyak, E. Ehrichs:
Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. ISQED 2006: 260-265
2004
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J. F. Buller, R. van Bentum, J. Cheek, E. Ehrichs, M. Horstmann, S. Searles:
Opportunities and challenges in asymmetric device implementation [CMOS device scaling]. CICC 2004: 229-232

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