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"A study on NBTI-induced delay degradation considering stress frequency ..."

Zuitoku Shin et al. (2018)

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DOI: 10.1109/ISQED.2018.8357296

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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  dblp key:
  - conf/isqed/ShinMBSHS18
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  - https://dblp.org/rec/conf/isqed/ShinMBSHS18
Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato:
A study on NBTI-induced delay degradation considering stress frequency dependence. ISQED 2018: 251-256

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