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"Statistical analysis of process variation induced SRAM electromigration ..."

Zhong Guan, Malgorzata Marek-Sadowska, Sani R. Nassif (2014)

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DOI: 10.1109/ISQED.2014.6783395

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/isqed/GuanMN14
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Zhong Guan, Malgorzata Marek-Sadowska, Sani R. Nassif:
Statistical analysis of process variation induced SRAM electromigration degradation. ISQED 2014: 700-707

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