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"Delay Impact on Process Variation of Interconnect throughout technology ..."

Myeongwoo Jin, Doekkeun Oh, Juho Kim (2022)

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DOI: 10.1109/ISOCC56007.2022.10031498

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-15

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  dblp key:
  - conf/isocc/JinOK22a
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Myeongwoo Jin, Doekkeun Oh, Juho Kim:
Delay Impact on Process Variation of Interconnect throughout technology scaling. ISOCC 2022: 388-389

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