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"Scan based process parameter estimation through path-delay inequalities."

Takumi Uezono et al. (2010)

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DOI: 10.1109/ISCAS.2010.5537813

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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  - conf/iscas/UezonoTSHMOS10
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Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato:
Scan based process parameter estimation through path-delay inequalities. ISCAS 2010: 3553-3556

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