"A new charge pump circuit dealing with gate-oxide reliability issue in ..."

Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai (2004)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2016-05-20

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  - https://dblp.org/rec/conf/iscas/KerCT04
Ming-Dou Ker, Shih-Lun Chen, Chia-Sheng Tsai:
A new charge pump circuit dealing with gate-oxide reliability issue in low-voltage processes. ISCAS (1) 2004: 321-324

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