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"Towards the understanding of ferroelectric-intrinsic variability and ..."

Yishan Wu et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118078

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/WuCLRJ23
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Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji:
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. IRPS 2023: 1-6

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