Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Lateral profiling of HCI induced damage in ultra-scaled FinFET devices ..."

Miaomiao Wang et al. (2018)

> Home

Details and statistics

DOI: 10.1109/IRPS.2018.8353639

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/WangSCS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/WangSCS18
Miaomiao Wang, Richard G. Southwick, Kangguo Cheng, James H. Stathis:
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics. IRPS 2018: 6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.