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"A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT."

William Vandendaele et al. (2018)

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DOI: 10.1109/IRPS.2018.8353580

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/irps/VandendaeleGLMT18
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  - https://dblp.org/rec/conf/irps/VandendaeleGLMT18
William Vandendaele, Xavier Garros, Thomas Lorin, Erwan Morvan, A. Torres, René Escoffier, Marie-Anne Jaud, Marc Plissonnier, Fred Gaillard:
A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT. IRPS 2018: 4

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