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"Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect ..."

Taiki Uemura et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529357

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/UemuraCCLCHP24a
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Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae:
Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence. IRPS 2024: 1-5

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