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"Error elimination ECC by horizontal error detection and vertical-LDPC ECC ..."

Shun Suzuki et al. (2018)

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DOI: 10.1109/IRPS.2018.8353680

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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  - conf/irps/SuzukiDNMT18
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Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Kyoji Mizoguchi, Ken Takeuchi:
Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs. IRPS 2018: 7-1

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