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"Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric ..."

Ayse Sünbül et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/irps/SunbulAHRRDLKRO22
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  - https://dblp.org/rec/conf/irps/SunbulAHRRDLKRO22
Ayse Sünbül, Tarek Ali, Raik Hoffmann, Ricardo Revello, Yannick Raffel, Pardeep Duhan, David Lehninger, Kati Kühnel, Matthias Rudolph, Sebastian Oehler, Philipp Schramm, Malte Czernohorsky, Konrad Seidel, Thomas Kämpfe, Lukas M. Eng:
Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions. IRPS 2022: 11-1

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