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"Reliability studies of a 10nm high-performance and low-power CMOS ..."
Anisur Rahman et al. (2018)
- Anisur Rahman, Javier Dacuña, Pinakpani Nayak, Gerald S. Leatherman, Stephen Ramey:
Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. IRPS 2018: 6
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