"Reliability studies of a 10nm high-performance and low-power CMOS ..."

Anisur Rahman et al. (2018)

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DOI: 10.1109/IRPS.2018.8353648

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Anisur Rahman, Javier Dacuña, Pinakpani Nayak, Gerald S. Leatherman, Stephen Ramey:
Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. IRPS 2018: 6

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